CMS-3500S (350-800NM) accurate array spectroradiometer adopts the international most advanced holographic concave grating spectral technique. Its optical path design is unique with extremely low stray light. Meanwhile , we adopt Japan HAMAMATSU high accuracy TE Cooling,DLP&Plane array CCD.
Test Parameters:
(1) Relative spectral power distribution P(λ) ,PE(λ)
(2) chromaticity coordinates: ( x, y ), ( u, v ) (u´,v´)
(3) correlated color temperature: (CCT),（ERP EEI,SASO EEI,EU1369）
(4) color index: Ra; Ri ( I = 1-15) Ra; Ri(I=1-15), Gamut (saturation) index：Rf，Rg (IES-TM30-2018)，CQS：Qa,Qf,Qp,Qg,(Q1-Q15);
(5) color tolerance(SDCM) (including the international and national standards)
(6) hotometric parameters: luminous flux, Par and PPFPF(400-500nm), PF(500-600nm), PF(600-700nm),Pfuv (360-400nm), PFFR (700-800nm), photon efficiency (PPE)red ratio
(7) Peak wavelength, half width, color purity and main wavelength
(8) Color ratio, red and blue light ratio, ambient temperature (Tx), temperature inside the sphere (Ti)
>Measured wavelength range:350nm-800nm (near UV & visible light ), offers 200nm-1100nm for special( UV to near infrared )
>Wavelength accuracy:±0.3nm repeatability :±0.1nm
>Accuracy of chromaticity coordinates: ± 0.0003 ( standard A light source ), ± 0.002 ( LED light source)
>System spectral linear: ± 0.3%
>Accuracy of system photometric: class 1
>Correlated color temperature measurement range: 1500k-100000k
>Correlated color temperature accuracy:± 0.3%
>Color rendering index measurement error: ±( 0.3%rd+0.5 )
>Requirements of working environment:
Measured wavelength range:350nm-800nm
CCD has two working modes
Its optical path design is unique with extremely low stray light. Meanwhile , we adopt Japan HAMAMATSU high accuracy TE Cooling,DLP&Plane array CCD.
CIE 13.3:1995 Method of Measuring and Specifying Color Rendering of Light Sources
CIE 15-2004 Colorimery
CIE 84：1989 Measurement of luminous flux
CIE 127-2007 Measurement of LEDs
CIE 177-2007 Colour Rendering of White LED Light Sources
IESNA LM-79 Electrical and Photometric Mesaurements of Solid-State Liguting
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